MICRO-429 Metrology practicals

Lecturer(s):

Bruschini Claudio

Language:

English

Remark:

A suivre uniquement en parallèle de MICRO-428

Summary

The student will get familiar with the techniques learnt in class (MICRO-428) and will put them to practice with experiments in the laboratory. There will be a practical training for each theme covered in class; the students will also learn good practices during measurements.

Content

The topics covered by the course are summarized as follows:
  • Dark count rate (DCR) and afterpulsing statistics in photon-counting device
  • Sensitivity in photon-counting devices
  • Timing jitter measurements in single-photon detectors
  • Optical microscope construction and test
  • Scanning electron microscopy
  • Atomic force microscope

Keywords

SPAD, TCSPC, PDP, PDE, SPTR, CTR, DCR, AFM, SEM, optical microscopy

Learning Prerequisites

  • Required course: MICRO-428 Metrology
  • Recommended course: Design of experiments

Learning Outcomes

  • Choose an appropriate measurement methodology
  • Develop the understanding of measurement tools and instruments
  • Design a measurement experiment
  • Interpret measurement results
  • Investigate issues related to the accuracy and precision

Assessment Methods

Continuous assessment

Resources

Specialized labs

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