Lecturer(s) :
Bruschini ClaudioCharbon Edoardo
Fantner Georg
Vardi Ilan
Language:
English
Withdrawal
It is not allowed to withdraw from this subject after the registration deadline.Summary
Course introduces the concept of measurement in electrical, optical, and microscale domains, dealing with accuracy, and resolution. Weâll introduce techniques to handle intrinsic and extrinsic limitations of the measurement in these domains. Course ends with a quantum perspective.Content
The topics covered by the course are summarized as follows:
- Deconstruction class (W 1.1)
Classical metrology, current definitions (kg, C, A, V), Système International (W 1.2)
HW Series 1 (W 1.3)
- Basic statistics: random variables, random processes, probability
distribution functions, moments, statistical independence, correlation,
wide-sense stationary processes, ergodicity, Gaussian and Poisson
processes, Central Limit Theorem, time series analysis, elements of
estimation theory. Concepts of accuracy, precision, and resolution of a
measurement
(W 2 - W 3)
HW Series 2, 3 (W 2.3, W 3.3)
- Electrical metrology: currents, voltages, charges, noise sources (1/f,
RTS, shot, thermal, KT/C), averaging techniques, accuracy, precision,
error estimation, time estimation. Tools for electrical metrology
(lock-in, PLL, DLL, network analyser, etc.).
(W 4 - W 5 - W 6.1)
HW Series 4, 5 (W 4.3, W 5.3)
- Time
(W 6.2 - W 7.1)
HW Series 6 (W 6.3)
- Optical metrology: photons & wavelengths, intensity, photon
flux, image sensor parameters (optical gain, quantum efficiency, PRNU,
etc.). Tools for optical metrology. Optical system evaluation
(aberration, concentration factors, refraction, diffraction, vignetting,
Abbe's limit).
(W 7.2-W 8-W 9)
HW Series 7, 8, 9 (W 7.3, W 8.3, W 9.3)
- Microscale metrology: SPM/AFM, SEM, interferometry, measurement of
micro/nanoscale forces and distances, nanomechanical properties,
fundamental issues of nanomechanical metrology instruments.
(W 10 - W 11)
HW Series 10, 11 (W 10.3, W 11.3)
- Redefinition of SI, METAS.
(W 12)
- Quantum perspective: the f-U-I triangle, measuring randomness,
photon counting, single-electron detection, qubit metrology,
micro-temperature measurements and cryogenic limits.
(W 13 - W 14)
HW Series 12, 13 (W 13.3, W 14.3)
Keywords
Accuracy, precision, resolution, reproducibility, reliability, fidelity of the measurement
Learning Prerequisites
Required courses
Basic mathematics/physics
Recommended courses
Design of experiments
Learning Outcomes
By the end of the course, the student must be able to:- Develop measurement setups that yield reproducible results
- Analyze the accuracy and precision of a measurement for a certain resolution
- Interpret the quality of data from measurements
Assessment methods
Self-assessment (ungraded homework, exercise session presence verified); final exam during exam sessions.
Resources
Notes/Handbook
Specialized labs, references TBD.
- Professor: Claudio Bruschini
- Professor: Edoardo Charbon
- Professor: Georg Fantner
- Professor: Ilan Vardi
- Teacher: Simone Frasca
- Teacher: Bedirhan Ilik